Comprehensive DFT Implementation Services
Ensure defect-free silicon and maximize yield with our rigorous Design-for-Test (DFT) methodologies. We integrate advanced test structures early in the design cycle, optimizing fault coverage and minimizing test costs without compromising functional timing or area.
Advanced Test Architecture
Our team architects robust DFT solutions including scan insertion, compression, MBIST (Memory BIST), and boundary scan, ensuring your design is fully testable and compliant with industry standards like IEEE 1149.1 and 1687.
High-Coverage Pattern Generation
We utilize cutting-edge ATPG tools to generate high-efficiency test patterns that maximize stuck-at and transition fault coverage. Our thorough simulations ensure seamless pattern validation and rapid post-silicon bring-up.
3 Steps to Defect-Free Silicon
Our comprehensive Design-for-Test (DFT) methodology ensures high test coverage and manufacturing reliability for your complex SoCs. We integrate testability early in the design cycle to minimize test costs and accelerate post-silicon yield ramp-up without compromising PPA goals.
STEP ONE
DFT Architecture & Insertion
STEP TWO
Pattern Generation & Simulation
STEP THREE
Silicon Bring-up & Yield
Defining robust test structures including Scan compression, MBIST, and JTAG to ensure full observability and controllability.Generating high-efficiency ATPG patterns for stuck-at and transition faults
while verifying them through rigorous simulation.providing hands-on support for post-silicon validation, diagnosis of failure mechanisms, and yield enhancement.